top of page

Academy Series

​

Precision Optical Metrology Made Accessible

The SURFVIEW Academy Series is designed to bring high-resolution optical surface metrology into universities, teaching laboratories, research institutes, and entry-level quality control environments.

Built around white light interferometry technology, the Academy Series delivers nanometer-scale vertical resolution in a compact, accessible, and easy-to-operate platform.

Designed for Education and Everyday Research

The Academy Series focuses on simplicity, reliability, and measurement quality.

It allows users to perform advanced 3D surface measurements without the complexity of large industrial systems.

Typical applications include:

  • Surface roughness analysis

  • Step height measurements

  • Scratch and defect inspection

  • Thin film characterization

  • Microstructure analysis

  • Academic teaching and demonstrations

  • Routine laboratory measurements

Key Advantages

Easy to Use

The manual architecture keeps operation intuitive and accessible for students, researchers, and first-time users.

Nanometer Vertical Resolution

The system combines VSI, VEI, and VPI interferometry methods to achieve extremely high vertical sensitivity.

  • VSI / VEI: < 0.5 nm

  • VPI: < 0.1 nm

Compact Laboratory Footprint

The Academy Series integrates easily into laboratory environments while maintaining excellent measurement stability.

Cost-Effective Metrology Platform

An ideal solution for laboratories seeking professional optical metrology performance with optimized investment costs.

Core Features

Measuring Principle

VSI / VEI / VPI

SCAN RANGE

Up to 200µm

VERTICAL RESOLUTION

Down to < 0.1 nm

WORK AREA

100 x 100 mm

X/Y STAGE

Manual

ILLUMINATION

White LED / Green LED

Optimized for Academic and Research Environments

The SURFiEW Academy Series is particularly well suited for:

  • Universities

  • Research laboratories

  • Materials science departments

  • Engineering schools

  • Microscopy facilities

  • Entry-level industrial laboratories

Reliable Interferometry Technology

Using visible light interferometry, the Academy Series performs fully non-contact surface measurements with extremely high vertical precision while preserving delicate samples.

This makes it suitable for:

  • Soft materials

  • Thin films

  • Precision machined surfaces

  • Semiconductor samples

  • Optical components

Software Environment

The system includes:

  • Surface View acquisition software

  • Surface MAP analysis software

Optional advanced analysis capabilities are available through MountainsMap for extended surface characterization and reporting workflows.

A Practical Entry into Advanced Surface Metrology

The SURFiEW Academy Series offers a balanced combination of precision, simplicity, and affordability, making it an ideal starting point for laboratories adopting optical 3D surface metrology technologies.

bottom of page